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検索キーワード:(件名: Pattern perception Congresses)
該当件数:9件
Proceedings : 10th International Conference on Pattern Recognition, 16-21 June 1990, Atlantic City, New Jersey, USA
v. 1,v. 2. - Los Alamitos, CA ; Washington, D.C. ; Tokyo : IEEE Computer Society Press , c1990
図書
Pattern recognition theory and applications : proceedings of the NATO Advanced Study Institute held at St. Anne's College, Oxford, March 29-April 10, 1981 / edited by J. Kittler, K.S. Fu, and L.F. Pau
Dordrecht, Holland ; Boston : D. Reidel. - Hingham, MA : Sold and distributed in the U.S.A. and Canada by Kluwer Boston , c1982. - (NATO advanced study institutes series ; ser. C . Mathematical and physical sciences ; v. 81)
Pattern formation by dynamic systems and pattern recognition : proceedings of the International Symposium on Synergetics at Schloß Elmau, Bavaria, April 30-May 5, 1979 / editor, H. Haken
: U.S.,: Germany. - Berlin ; New York : Springer-Verlag , 1979. - (Springer series in synergetics ; v. 5)
Pattern recognition theory and applications / edited by Pierre A. Devijver, Josef Kittler
: Germany,: U.S.. - Berlin ; Tokyo : Springer-Verlag , c1987. - (NATO ASI series ; ser. F . Computer and systems sciences ; v. 30)
Science on form : proceedings of the First International Symposium for Science on Form, University of Tsukuba, Japan, November 26-30, 1985 / general editor, S. Ishizaka ; editors, Y. Kato, R. Takaki, and J. Toriwaki
Tokyo : KTK Scientific Publishers. - Dordrecht ; Tokyo : D. Reidel , c1986
Science on form : 3D dynamic morphometry for bridge between structure and function : proceedings of the Second International Symposium for Science on Form, University of Tsukuba, Japan, October 19-21, 1988 / editor, S. Ishizaka
Tokyo : KTK Scientific Publishers , c1990
Signal processing and pattern recognition in nondestructive evaluation of materials / edited by C.H. Chen
: Germany,: U.S.. - Berlin ; Tokyo : Springer-Verlag , c1988. - (NATO ASI series ; ser. F . Computer and systems sciences ; v. 44)
Techniques for 3-D machine perception / edited by Azriel Rosenfeld
Amsterdam ; New York : North-Holland , 1986. - (Machine intelligence and pattern recognition ; v. 3)
Multiple classifier systems : 6th International Workshop, MCS 2005, Seaside, CA, USA, June 13-15, 2005 : proceedings / Nikunj C. Oza ... [et al.] (eds.)
Berlin : Springer , c2005. - (Lecture notes in computer science ; 3541)