Mendeley出力
Reliability of Nanoscale Circuits and Systems : Methodologies and Circuit Architectures / by Miloš Stanisavljević, Alexandre Schmid, Yusuf Leblebici
| データ種別 | 電子ブック |
|---|---|
| 著者標目 | *Stanisavljević, Miloš Schmid, Alexandre Leblebici, Yusuf SpringerLink (Online service) |
| 出版情報 | New York, NY : Springer Science+Business Media, LLC , 2011 |
書誌詳細を非表示
| 巻次 | ISBN:9781441962171 |
|---|---|
| 大きさ | v.: digital |
| 本文言語 | 英語 |
| 件 名 | LCSH:Engineering LCSH:Computer aided design LCSH:System safety LCSH:Systems engineering FREE:Engineering FREE:Circuits and Systems FREE:Quality Control, Reliability, Safety and Risk FREE:Computer-Aided Engineering (CAD, CAE) and Design |
| 書誌ID | OB00004493 |
| ISBN | 9781441962171 |
| NCID | LB40006451 |