Mendeley出力
Reliability of Microtechnology : Interconnects, Devices and Systems / by Johan Liu, Olli Salmela, Jussi Sarkka, James E. Morris, Per-Erik Tegehall, Cristina Andersson
| データ種別 | 電子ブック |
|---|---|
| 著者標目 | *Liu, Johan Salmela, Olli Sarkka, Jussi Morris, James E. Tegehall, Per-Erik Andersson, Cristina SpringerLink (Online service) |
| 出版情報 | New York, NY : Springer Science+Business Media, LLC , 2011 |
書誌詳細を非表示
| 版 | 1 |
|---|---|
| 巻次 | ISBN:9781441957603 |
| 大きさ | v.: digital |
| 本文言語 | 英語 |
| 件 名 | LCSH:Engineering LCSH:System safety LCSH:Electronics LCSH:Optical materials FREE:Engineering FREE:Electronics and Microelectronics, Instrumentation FREE:Optical and Electronic Materials FREE:Quality Control, Reliability, Safety and Risk FREE:Nanotechnology and Microengineering |
| 書誌ID | OB00003908 |
| ISBN | 9781441957603 |
| NCID | LB40006532 |