Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces / by Weronika Walkosz
(Springer Theses)
データ種別 | 電子ブック |
---|---|
著者標目 | *Walkosz, Weronika SpringerLink (Online service) |
出版者 | New York, NY : Springer Science+Business Media, LLC |
出版年 | 2011 |
書誌詳細を非表示
巻次 | ISBN:9781441978172 |
---|---|
大きさ | v.: digital |
本文言語 | 英語 |
件 名 | LCSH:Microreactors LCSH:Chemistry, Physical organic LCSH:Materials FREE:Materials Science FREE:Ceramics, Glass, Composites, Natural Methods FREE:Spectroscopy and Microscopy FREE:Physical Chemistry FREE:Structural Materials FREE:Atomic/Molecular Structure and Spectra FREE:Microengineering |
書誌ID | OB00001935 |
ISBN | 9781441978172 |
NCID | LB40004601 |