Mendeley出力
Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A. / editors, James R. Lloyd, Frederick G. Yost, Paul S. Ho
(Materials Research Society symposium proceedings ; v. 225)
| データ種別 | 図書 |
|---|---|
| 著者標目 | Lloyd, J. R. (James R.) Yost, Frederick G. Ho, P. S. Materials Research Society MRS Symposium on Materials Reliability Issues in Microelectronics (1st : 1991 : Anaheim, Calif.) |
| 出版者 | Pittsburgh, Pa. : Materials Research Society |
| 出版年 | c1991 |
書誌詳細を非表示
| 巻次 | ISBN:1558991190 |
|---|---|
| 大きさ | xiii, 358 p. : ill. ; 24 cm |
| 本文言語 | 英語 |
| 一般注記 | Proceedings of the First MRS Symposium on Materials Reliability Issues in Microelectronics Includes bibliogrpahical references and index |
| 件 名 | LCSH:Microelectronics -- Reliability -- Congresses
全ての件名で検索
LCSH:Microelectronics -- Materials -- Testing -- Congresses 全ての件名で検索 LCSH:Electrodiffusion -- Congresses 全ての件名で検索 LCSH:Microstructure -- Congresses 全ての件名で検索 |
| 分 類 | LCC:TK7874 DC20:621.381 |
| 書誌ID | 1000050477 |
| ISBN | 1558991190 |
| NCID | BA14185757 |