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Sample Preparation Handbook for Transmission Electron Microscopy : Methodology / by Jeanne Ayache, Luc Beaunier, Jacqueline Boumendil, Gabrielle Ehret, Danièle Laub

データ種別 電子ブック
著者標目 *Ayache, Jeanne author
Beaunier, Luc author
Boumendil, Jacqueline author
Ehret, Gabrielle author
Laub, Danièle author
SpringerLink (Online service)
出版者 (New York, NY : Springer New York : Imprint: Springer)
出版年 2010

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URL 図書館共通

EB007371
9780387981826 禁帯出

書誌詳細を非表示

巻次 ISBN:9780387981826
大きさ XXIII, 250 p : online resource
一般注記 Methodology: General Introduction -- to Materials -- The Different Observation Modes in Electron Microscopy (SEM, TEM, STEM) -- Materials Problems and Approaches for TEM and TEM/STEM Analyses -- Physical and Chemical Mechanisms of Preparation Techniques -- Artifacts in Transmission Electron Microscopy -- Selection of Preparation Techniques Based on Material Problems and TEM Analyses -- Comparisons of Techniques -- Conclusion: What Is a Good Sample?
This two-volume Handbook is a comprehensive and authoritative guide to sample preparation for the transmission electron microscope. This first volume covers general theoretical and practical aspects of the methodologies used for TEM analysis and observation of any sample. The information will help you to choose the best preparative technique for your application taking into account material types, structures, and their properties. Physical properties, material classification, and microstructures are considered together with a thorough description of the physics and chemistry of sample preparation and the main artifacts brought about by mechanical, physical and chemical methods, principles which are also applicable to sample preparation for the SEM, AFM etc.. Also included is a discussion of how to combine techniques for complex sample analysis and to obtain a TEM thin slice. Sample Preparation Handbook for Transmission Electron Microscopy: Methodology will guide you through the most current techniques for successful sample preparation in all fields from materials science to biology. Key Features of the Handbook: Combines all of the latest techniques for the preparation of mineral to biological samples Compares techniques in terms of their application areas, limitations, artifacts, and types of analysis (macroscopic, atomic, or molecular level) Describes physical characteristics, chemistry, structure/texture, and orientation properties of materials in relation to the most appropriate type of TEM analysis Links to a complementary interactive database website which is available to scientists worldwide* Written by authors with 100 years of combined experience in electron microscopy http://temsamprep.in2p3.fr/
HTTP:URL=http://dx.doi.org/10.1007/978-0-387-98182-6
件 名 LCSH:Materials science
LCSH:Mineralogy
LCSH:Microscopy
LCSH:Nanotechnology
FREE:Materials Science
FREE:Characterization and Evaluation of Materials
FREE:Biological Microscopy
FREE:Mineralogy
FREE:Nanotechnology
分 類 LCC:TA404.6
DC23:620.11
書誌ID OB00007371
ISBN 9780387981826

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