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Advanced Computing in Electron Microscopy / by Earl J. Kirkland
| データ種別 | 電子ブック |
|---|---|
| 著者標目 | *Kirkland, Earl J author SpringerLink (Online service) |
| 出版情報 | 製作表示:Boston, MA : Springer US , 2010 |
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| 巻次 | ISBN:9781441965332 |
|---|---|
| 大きさ | X, 289 p : online resource |
| 一般注記 | The Transmission Electron Microscope -- Linear Image Approximations -- Sampling and the Fast Fourier Transform -- Calculation of Images of Thin Specimens -- Theory of Calculation of Images of Thick Specimens -- Multislice Applications and Examples -- The Programs -- Plotting Transfer Functions -- The Fourier Projection Theorem -- Atomic Potentials and Scattering Factors -- Bilinear Interpolation -- 3D Perspective View Advanced Computing in Electron Microscopy, 2nd Edition, brings together diverse information on image simulation. An invaluable resource, this book provides information on various methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. This text will serve as a great tool for students at the advanced undergraduate or graduate level, as well as experienced researchers in the field. This enhanced second edition includes: -descriptions of new developments in the field -updated references -additional material on aberration corrected instruments and confocal electron microscopy -expanded and improved examples and sections to provide stronger clarity HTTP:URL=http://dx.doi.org/10.1007/978-1-4419-6533-2 |
| 件 名 | LCSH:Physics LCSH:Numerical analysis LCSH:Spectroscopy LCSH:Microscopy LCSH:Electrical engineering LCSH:Materials science FREE:Physics FREE:Spectroscopy and Microscopy FREE:Electrical Engineering FREE:Characterization and Evaluation of Materials FREE:Numeric Computing |
| 分 類 | LCC:QC450-467 LCC:QC718.5.S6 DC23:621.36 |
| 書誌ID | OB00006927 |
| ISBN | 9781441965332 |