Coherent Light Microscopy : Imaging and Quantitative Phase Analysis / edited by Pietro Ferraro, Adam Wax, Zeev Zalevsky
(Springer Series in Surface Sciences ; 46)
データ種別 | 電子ブック |
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著者標目 | *Ferraro, Pietro Wax, Adam Zalevsky, Zeev SpringerLink (Online service) |
出版者 | Berlin, Heidelberg : Springer-Verlag Berlin Heidelberg |
出版年 | 2011 |
書誌詳細を非表示
巻次 | ISBN:9783642158131 |
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大きさ | v.: digital |
本文言語 | 英語 |
件 名 | LCSH:Physics LCSH:Radiology, Medical LCSH:Microscopy LCSH:Biomaterials LCSH:Nanotechnology LCSH:Surfaces (Physics) FREE:Physics FREE:Optics, Optoelectronics, Plasmonics and Optical Devices FREE:Biological Microscopy FREE:Characterization and Evaluation of Materials FREE:Biomaterials FREE:Nanotechnology FREE:Imaging / Radiology |
書誌ID | OB00005159 |
ISBN | 9783642158131 |
NCID | LB40004575 |