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Dependability in Electronic Systems : Mitigation of Hardware Failures, Soft Errors, and Electro-Magnetic Disturbances / by Nobuyasu Kanekawa, Eishi H. Ibe, Takashi Suga, Yutaka Uematsu
| データ種別 | 電子ブック |
|---|---|
| 著者標目 | *Kanekawa, Nobuyasu Ibe, Eishi H. Suga, Takashi Uematsu, Yutaka SpringerLink (Online service) |
| 出版者 | New York, NY : Springer Science+Business Media, LLC |
| 出版年 | 2011 |
書誌詳細を非表示
| 版 | 1 |
|---|---|
| 巻次 | ISBN:9781441967152 |
| 大きさ | v.: digital |
| 本文言語 | 英語 |
| 件 名 | LCSH:Engineering LCSH:Computer aided design LCSH:Systems engineering FREE:Engineering FREE:Circuits and Systems FREE:Computer-Aided Engineering (CAD, CAE) and Design |
| 書誌ID | OB00001435 |
| ISBN | 9781441967152 |
| NCID | LB40006469 |