Scanning electron microscopy and X-ray microanalysis / Joseph I. Goldstein ... [et al.]
データ種別 | 図書 |
---|---|
著者標目 | *Goldstein, Joseph, 1939- Newbury, Dale E. Michael, Joseph R. Ritchie, Nicholas W.M. Scott, John Henry J. Joy, David C., 1943- |
出版者 | New York : Springer Science+Business Media |
出版年 | 2018 |
書誌詳細を非表示
版 | 4th ed |
---|---|
巻次 | : [hbk] ; ISBN:9781493966745 |
大きさ | xxiii, 550 p. : ill. (chiefly col.) ; 29 cm |
本文言語 | 英語 |
一般注記 | Includes bibliographical references and index Other authors: Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy "Extras online"-- Cover |
件 名 | LCSH:Electron microscopy LCSH:Scanning electron microscopy LCSH:X-ray microanalysis |
分 類 | DC23:502.825 NDC9:549.97 |
書誌ID | 1000234709 |
ISBN | 9781493966745 |
NCID | BB25623321 |