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Scanning electron microscopy and X-ray microanalysis / Joseph I. Goldstein ... [et al.]
| データ種別 | 図書 |
|---|---|
| 著者標目 | *Goldstein, Joseph, 1939- Newbury, Dale E. Michael, Joseph R. Ritchie, Nicholas W.M. Scott, John Henry J. Joy, David C., 1943- |
| 出版者 | New York : Springer Science+Business Media |
| 出版年 | 2018 |
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| 版 | 4th ed |
|---|---|
| 巻次 | : [hbk] ; ISBN:9781493966745 |
| 大きさ | xxiii, 550 p. : ill. (chiefly col.) ; 29 cm |
| 本文言語 | 英語 |
| 一般注記 | Includes bibliographical references and index Other authors: Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy "Extras online"-- Cover |
| 件 名 | LCSH:Electron microscopy LCSH:Scanning electron microscopy LCSH:X-ray microanalysis |
| 分 類 | DC23:502.825 NDC9:549.97 |
| 書誌ID | 1000234709 |
| ISBN | 9781493966745 |
| NCID | BB25623321 |