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EMIS datareviews series

データ種別 図書
出版情報 London ; New York : INSPEC, Institution of Electrical Engineers

子書誌情報を非表示

1 no. 1 Properties of amorphous silicon 2nd ed. - London : INSPEC, Institution of Electrical Engineers , c1989
2 no. 18 Properties of porous silicon / edited by Leigh Canham London : INSPEC, Institution of Electrical Engineers , c1997
3 no. 19 Properties of amorphous silicon and its alloys / edited by Tim Searle London : INSPEC, Institution of Electrical Engineers , c1998

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本文言語 英語
書誌ID 1000083305
NCID BA01124057