EMIS datareviews series
データ種別 | 図書 |
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出版情報 | London ; New York : INSPEC, Institution of Electrical Engineers |
子書誌情報を非表示
1 | no. 1 Properties of amorphous silicon 2nd ed. - London : INSPEC, Institution of Electrical Engineers , c1989 |
2 | no. 18 Properties of porous silicon / edited by Leigh Canham London : INSPEC, Institution of Electrical Engineers , c1997 |
3 | no. 19 Properties of amorphous silicon and its alloys / edited by Tim Searle London : INSPEC, Institution of Electrical Engineers , c1998 |
書誌詳細を非表示
本文言語 | 英語 |
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書誌ID | 1000083305 |
NCID | BA01124057 |