Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A. / editors, James R. Lloyd, Frederick G. Yost, Paul S. Ho
(Materials Research Society symposium proceedings ; v. 225)
データ種別 | 図書 |
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著者標目 | Lloyd, J. R. (James R.) Yost, Frederick G. Ho, P. S. Materials Research Society MRS Symposium on Materials Reliability Issues in Microelectronics (1st : 1991 : Anaheim, Calif.) |
出版者 | Pittsburgh, Pa. : Materials Research Society |
出版年 | c1991 |
書誌詳細を非表示
巻次 | ISBN:1558991190 |
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大きさ | xiii, 358 p. : ill. ; 24 cm |
本文言語 | 英語 |
一般注記 | Proceedings of the First MRS Symposium on Materials Reliability Issues in Microelectronics Includes bibliogrpahical references and index |
件 名 | LCSH:Microelectronics -- Reliability -- Congresses
全ての件名で検索
LCSH:Microelectronics -- Materials -- Testing -- Congresses 全ての件名で検索 LCSH:Electrodiffusion -- Congresses 全ての件名で検索 LCSH:Microstructure -- Congresses 全ての件名で検索 |
分 類 | LCC:TK7874 DC20:621.381 |
書誌ID | 1000050477 |
ISBN | 1558991190 |
NCID | BA14185757 |